Welcome to Galaxy Examinator reports!
                 
  Global info
Global info about the data processed: program name, lot, sub-lot information and much more...

 

 

Wafer map
Wafermap of bin and parametric tests: a picture is worth a 1000 words!...Quickly detect and investigate abnormal patterns or topological process problems.

More Reports
From trend chart, correlation to box plot: all the advanced reports you need for sharp data analysis! If an index page exists, you may skip it.

 

   Test Statistics
Table with all test info, mean, range, Cp, Cpk, drifts...To skip the test index page, go to the first table page.
   Binning
Includes the yield summary for each of all the bin results.

 

Snapshots Gallery
All charts and tables snapshots taken during the interactive drill navigations.
 
                 
   Histograms
Distribution charts of your tests. Helps you investigate process not well centered. To skip the test index page, go to the first histogram page.
 

 

 Pareto
Sorted lists for: Cp, Cpk, failure rates, binnings, correlation drifts...
   

 

 

 

: Save this report settings into a script for next time...you'll enjoy fully automated report creation!