| File name |
C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer01-02-03-04.stdf |
| Start time |
Wed Dec 03 11:58:46 2003
|
| Test duration |
58 minutes 31 seconds |
| Program |
mcc |
| Lot |
MJD39S00KY |
| WaferID |
01 |
| Parts processed |
All Data / parts (any Bin) |
| Data from Sites |
All sites |
| Average test time |
6.247 sec. / device (includes tester idle time between parts) |
|
|
| File name |
C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer01-02-03-04.stdf |
| Start time |
Wed Dec 03 12:58:16 2003
|
| Test duration |
57 minutes 42 seconds |
| Program |
mcc |
| Lot |
MJD39S00KY |
| WaferID |
02 |
| Parts processed |
All Data / parts (any Bin) |
| Data from Sites |
All sites |
| Average test time |
6.160 sec. / device (includes tester idle time between parts) |
|
|
| File name |
C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer01-02-03-04.stdf |
| Start time |
Wed Dec 03 13:56:58 2003
|
| Test duration |
58 minutes 36 seconds |
| Program |
mcc |
| Lot |
MJD39S00KY |
| WaferID |
03 |
| Parts processed |
All Data / parts (any Bin) |
| Data from Sites |
All sites |
| Average test time |
6.256 sec. / device (includes tester idle time between parts) |
|
|
| File name |
C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer01-02-03-04.stdf |
| Start time |
Wed Dec 03 14:56:33 2003
|
| Test duration |
1 hour 04 minutes 28 seconds |
| Program |
mcc |
| Lot |
MJD39S00KY |
| WaferID |
04 |
| Parts processed |
All Data / parts (any Bin) |
| Data from Sites |
All sites |
| Average test time |
1.696 sec. / device (includes tester idle time between parts) |