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Report from Examinator Characterization - V3.4 B11
Report created Fri Dec 05 17:14:47 2003
Data processed 20.4 MB (21372194 bytes)
Processing time 15.42 seconds - Speeeeeeedy!
Processing speed 1385.8 KB/sec
Examinator expires Thu Dec 11 2003

Group name: DataSet_1

File name C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer01-02-03-04.stdf
Start time Wed Dec 03 11:58:46 2003
Test duration 58 minutes 31 seconds
Program mcc
Lot MJD39S00KY
WaferID 01
Parts processed All Data / parts (any Bin)
Data from Sites All sites
Average test time 6.247 sec. / device (includes tester idle time between parts)


File name C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer01-02-03-04.stdf
Start time Wed Dec 03 12:58:16 2003
Test duration 57 minutes 42 seconds
Program mcc
Lot MJD39S00KY
WaferID 02
Parts processed All Data / parts (any Bin)
Data from Sites All sites
Average test time 6.160 sec. / device (includes tester idle time between parts)


File name C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer01-02-03-04.stdf
Start time Wed Dec 03 13:56:58 2003
Test duration 58 minutes 36 seconds
Program mcc
Lot MJD39S00KY
WaferID 03
Parts processed All Data / parts (any Bin)
Data from Sites All sites
Average test time 6.256 sec. / device (includes tester idle time between parts)


File name C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer01-02-03-04.stdf
Start time Wed Dec 03 14:56:33 2003
Test duration 1 hour 04 minutes 28 seconds
Program mcc
Lot MJD39S00KY
WaferID 04
Parts processed All Data / parts (any Bin)
Data from Sites All sites
Average test time 1.696 sec. / device (includes tester idle time between parts)




Report created with: Examinator Characterization - V3.4 B11 - www.galaxysemi.com