| File name |
C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer05-06.stdf |
| Start time |
Thu Dec 04 09:17:00 2003
|
| Test duration |
58 minutes 36 seconds |
| Program |
mcc |
| Lot |
MJD21H00KY |
| WaferID |
01 |
| Parts processed |
All Data / parts (any Bin) |
| Data from Sites |
All sites |
| Average test time |
6.256 sec. / device (includes tester idle time between parts) |
|
|
| File name |
C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer05-06.stdf |
| Start time |
Thu Dec 04 10:16:37 2003
|
| Test duration |
56 minutes 25 seconds |
| Program |
mcc |
| Lot |
MJD21H00KY |
| WaferID |
02 |
| Parts processed |
All Data / parts (any Bin) |
| Data from Sites |
All sites |
| Average test time |
3.012 sec. / device (includes tester idle time between parts) |