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Report from Examinator Characterization - V3.4 B11
Report created Fri Dec 05 17:17:27 2003
Data processed 10.1 MB (10564264 bytes)
Processing time 7.33 seconds - Speeeeeeedy!
Processing speed 1441.0 KB/sec
Examinator expires Thu Dec 11 2003

Group name: DataSet_1

File name C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer05-06.stdf
Start time Thu Dec 04 09:17:00 2003
Test duration 58 minutes 36 seconds
Program mcc
Lot MJD21H00KY
WaferID 01
Parts processed All Data / parts (any Bin)
Data from Sites All sites
Average test time 6.256 sec. / device (includes tester idle time between parts)


File name C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer05-06.stdf
Start time Thu Dec 04 10:16:37 2003
Test duration 56 minutes 25 seconds
Program mcc
Lot MJD21H00KY
WaferID 02
Parts processed All Data / parts (any Bin)
Data from Sites All sites
Average test time 3.012 sec. / device (includes tester idle time between parts)




Report created with: Examinator Characterization - V3.4 B11 - www.galaxysemi.com