| Wafer map type | Show Software binnings |
| Total dies tested | 1124 |
| Top 10 Software Binning | 1 | 8 | 3 | 10 | 11 | 9 | 4 |
| Color | |||||||
| Pass/Fail | P | F | F | F | F | F | F |
| Percentage | 63.0% | 19.0% | 8.4% | 3.5% | 3.0% | 3.0% | 0.2% |
| Total count | 708 | 213 | 94 | 39 | 34 | 34 | 2 |
| File | C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer05-06.stdf |
| Parts processed | All Data / parts (any Bin) |
| Data from Sites | All sites |
| Lot | MJD21H00KY |
| Wafer ID | 01 |
| Wafer size | 15 cm |
| Die size | width: 0.4392 cm / height: 0.4439 cm |
| Wafer started | Thu Dec 04 09:17:00 2003 |
| Wafer ended | Thu Dec 04 10:15:36 2003 |
| Wafer tested in | 58 minutes 36 seconds |
| Average device test time | 6.256 sec. |
| Wafer area covered | LowX=11, LowY=11, HighX=30, HighY=44 |

| File | C:/Program Files/Galaxy Examinator/MCC-I2.1/Wafer05-06.stdf |
| Parts processed | All Data / parts (any Bin) |
| Data from Sites | All sites |
| Lot | MJD21H00KY |
| Wafer ID | 02 |
| Wafer size | 15 cm |
| Die size | width: 0.4392 cm / height: 0.4439 cm |
| Wafer started | Thu Dec 04 10:16:37 2003 |
| Wafer ended | Thu Dec 04 11:12:54 2003 |
| Wafer tested in | 56 minutes 17 seconds |
| Average device test time | 3.004 sec. |
| Wafer area covered | LowX=11, LowY=11, HighX=30, HighY=44 |
