| MCC-I2.1 Test results legend | |||||
| Fail | Type | Flag | |||
| 1 | Pass | GREEN | |||
| 3 | Functional | RED | |||
| 4 | Delay line | RED | |||
| 8 | VDD Threshold | YELLOW | |||
| 9 | VOUT | RED | |||
| 10 | Continuity | RED | |||
| 11 | Power | RED | |||
| Field: | |||||
| PDB | Identifier in the Production Data Base | ||||
| Dev | Is the sequential number of the tested device and it is reported in the test logfiles | ||||
| X,Y | Are the coordinate of the MCC-I2 die on the wafer. Wafer are oriented with the notch on the right. X is increasing to the right, Y is increasing going down (see wafer maps) | ||||
| Die | Is the MCC die in the reticle. There are 4 chips/reticle (A,B,C,D). This information is redundant being it a univocal function of X,Y. | ||||
| Fail | "Fail" is the type of test failure. If "fail"=1 (flag = GREEN) the chip has passed all the tests. If "fail"=8 (flag = YELLOW) the chip passed all the tests but with a VDD higher than 1.86 V. All the other values of "fail" (flag = RED) are rejected chip. | ||||
| VDD | Is the minum value of VDD the MCC passes the special functional test. | ||||
| Flag | GREEN: the chip passed all functional tests and the special functional test at VDD ≤ 1.86 V | ||||
| YELLOW: the chip passed all functional test but the VDD at which it passed the special functional tes is greater than 1.86 V. The chips are inked but they can be used for special applications. YELLOW chips will not go into ATLAS. | |||||
| RED: the chip failed some tests. Chip is rejected and inked. | |||||