Single-chip devices tested in Genoa

For each of the devices a scan of the pulse magnitude is performed. For each channel an error function is fit to the efficiency versus charge plot in order to determine the threshold and ENC. The time over threshold calibration relation is derived for each channel by fitting a function of the form T= A + B/(Q+C) to a plot of mean TOT

(in BCO unit) versus input charge in electrons.

For each devices we provide: threshold and noise plots, missing bumps and shorts,

time over threshold calibration plots, time over threshold data.

  Information on flip-chipping