For each of the devices a scan of the pulse magnitude is performed. For each channel an error function is fit to the efficiency versus charge plot in order to determine the threshold and ENC. The time over threshold calibration relation is derived for each channel by fitting a function of the form T= A + B/(Q+C) to a plot of mean TOT
(in BCO unit) versus input charge in electrons.
For each devices we provide: threshold and noise plots, missing bumps and shorts,
time over threshold calibration plots, time over threshold data.
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Information on flip-chipping
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CIS-ST2-FE_B (Ge_B_6)
Tile-2, type CIS, single-chip detector (ALENIA bumps), April 99
CIS-SAN-FE_B (Ge_B_7)
Analogue, type CIS, single-chip detector (ALENIA bumps), May 99
CIS-ST2-FE_C (Ge_C_1)
Tile-2, type CIS, single-chip detector (ALENIA bumps), March 99
CIS-ST1-FE_C (Ge_C_2)
Tile-1, type CIS, single-chip detector (ALENIA bumps)
CIS-SSG-FE_B (Ge_B_8)
SSG, type CIS, single-chip detector (ALENIA bumps), June 99
CIS-SSG-FE_B (Ge_B_9)
SSG, type CIS, single-chip detector (ALENIA bumps), June 99
CIS-SSG-FE_B (Ge_B_13)
SSG, type CIS, single-chip detector (ALENIA bumps and flip-chip), January 00
CIS-ST1-FE_C (Ge_C_5)
Tile-1, type CIS, single-chip detector (ALENIA bumps), June 99
CIS-ST1-FE_C (Ge_C_6)
Tile-1, type CIS, single-chip detector (ALENIA bumps), re-worked, July 99
CIS-ST1-FE_C (Ge_C_7)
Tile-1, type CIS, single-chip detector (ALENIA bumps and flip-chip), January 00
CIS-SSG-FE_C (Ge_C_4)
SSG 1.5, type CIS, single-chip detector (ALENIA bumps), irradiated to 5 10**14 55 MeV protons, May 99
ST-SMD1 FE_B (NOTOXY1)
single-chip detector (ALENIA bumps), irradiated to 3.2 10**14 n/cm**2, May 00
ST-SMD2 FE_B (NOTOXY2)
single-chip detector (ALENIA bumps), irradiated to 5.6 10**14 n/cm**2, May 00
ST-SMD2 FE_B (OXY1)
single-chip detector (ALENIA bumps), oxygenated sensor, irradiated to 5.6 10**14 n/cm**2, May 00
ST-SMD1 FE_B (OXY2)
single-chip detector (ALENIA bumps), oxygenated sensor, irradiated to 3.2 10**14 n/cm**2, May 00
ST-NOD FE_B (OXY3)
single-chip detector (ALENIA bumps), oxygenated sensor, irradiated to 3.2 10**14 n/cm**2, May 00
SB-SMD FE_B (GE_B_14)
single-chip detector (ALENIA bumps), irradiated to 10**15 n/cm**2, July 00
ST-SMD FE_B (GE_B_15)
single-chip detector (ALENIA bumps), oxygenated sensor, irradiated to 10**15 n/cm**2, July 00
STLAD-01 FE_B (OXY4)
single-chip detector (ALENIA bumps), oxygenated sensor, irradiated (pion) to 3 10**14 n/cm**2, January 01
STSMD-01 FE_B (OXY5)
single-chip detector (ALENIA bumps), oxygenated sensor, irradiated (pion) to 5 10**14 n/cm**2, January 01
STLAD-01 FE_B (OXY6)
single-chip detector (ALENIA bumps), oxygenated sensor, irradiated (proton) to 1.07 10**15 n/cm**2, CO2, January 01
Maintened By Mario Cervetto (last update: